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C400 1.8-Inch NAND Flash SSD
Electrical Characteristics
Electrical Characteristics
Stresses greater than those listed may cause permanent damage to the device. This is a
stress rating only, and functional operation of the device at these or any other condi-
tions above those indicated in the operational sections of this specification is not im-
plied. Exposure to absolute maximum rating conditions for extended periods may affect
reliability.
Table 9: SATA Power Consumption
Sequential Write/Read Maximum
Density
Idle Average
Active Average
(128k transfer)
Unit
128GB
256GB
512GB
<85
<85
<100
150
160
280
3500
4000
5500
2000
2200
2500
mW
mW
mW
Notes:
1.
2.
3.
4.
Data taken at 25°C using a 6 Gb/s SATA interface.
Active average power measured while running MobileMark ? 2007 Productivity Suite.
DIPM (device-initiated power management) enabled.
Sequential power measured in IOMETER MAX with 128KB transfer size.
Table 10: Maximum Ratings
Parameter/Condition
Voltage input
Operating temperature
Non-operating temperature
Rate of temperature change
Relative humidity (non-condensing)
Symbol
V33
T C
Min
3.14
0
–40
–
5
Max
3.46
70
85
20
95
Unit
V
°C
°C
°C/hour
%
Note:
1. Temperature is best measured with a thermocouple attached to the center point of the
exterior of the case on the side where the SATA connector is not visible. If necessary,
contact with the drive label is acceptable.
Table 11: Shock and Vibration
Parameter/Condition
Operating shock
Operating vibration
Specification
1500 G/1.0ms
2–500Hz at 3.1G
PDF: 09005aef84559b2a
c400_1_8.pdf - Rev. F 11/13 EN
8
Micron Technology, Inc. reserves the right to change products or specifications without notice.
? 2011 Micron Technology, Inc. All rights reserved.
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